4D STEM ANALYSIS OF NI-RICH LAYERED CATHODE MATERIALS
Unlock New Perspectives in Cathode Material Analysis
To advance battery performance, researchers need to look deeper into the structural characteristics of Ni-rich cathodes. TESCAN, in partnership with the Ernst Ruska Center, has published a new application note demonstrating how precession-assisted 4D-STEM reveals critical insights into phase distribution, strain mapping, and microstructural stability.
Exploring Ni-Rich Materials with 4D STEM
What You’ll Discover
This in-depth study covers TESCAN TENSOR’s innovative 4D-STEM features, designed to support cutting-edge battery research. Key takeaways include:
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Comprehensive Phase Mapping: Precession-assisted 4D-STEM offers nanoscale resolution across large areas, mapping phase distribution with remarkable accuracy.
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Understanding Battery Degradation: The note provides insights into how phase heterogeneity and strain impact battery life, equipping researchers with data to address common degradation pathways.
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Efficiency in Data Processing: TESCAN TENSOR processes and visualizes phase-orientation maps in real time, allowing for more efficient analysis and smoother workflows.
Why TESCAN TENSOR?
TESCAN TENSOR’s high-resolution, real-time 4D-STEM technology is designed to meet the demands of modern battery research. The system provides:
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Precise control and high-resolution mapping capabilities
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Real-time data processing for streamlined analysis
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Practical solutions for revealing hidden structural information in battery materials
Explore the Full Application Note
Dive deeper into how TESCAN TENSOR’s 4D-STEM capabilities transform cathode material analysis and drive innovation in battery research.
Thank you for Your interest.
Further reading